CLP-based Multifrequency Test Generation for Analog Circuits.

Abdessatar Abderrahman Eduard Cerny Bozena Kaminska

Published in: VTS (1997)

Keyphrases

test generation
analog circuits
constraint logic programming
test cases
digital circuits
fault diagnosis
constraint programming
design automation
test sequences
symbolic execution
static analysis
quality assurance
neural network
software testing
expert systems
data flow
knowledge management
case study
databases