OBJECTS IN CLUTTERED SCENES
Experts
- Hideki Koike
- Ahmed Saoudi
- Yoko Yamakata
- Serguei Levachkine
- Federica Bogo
- Bugra Tekin
- Marc Pollefeys
- Gunther Heidemann
- Katsushi Ikeuchi
- Weitong Zhang
- Mitja Lustrek
- Jianxia Chen
- Jake K. Aggarwal
- Stefan Langerman
- Mete Ozay
- Reda Boukezzoula
- Yoshinori Kuno
- Zineb Abderrahmane
- Toyohide Watanabe
- Maurice Nivat
- Ping Tan
- Dong Jiang
- Daichi Saito
- Shanshan Wang
- Emmanouil Benetos
- Yu-Gang Jiang
- Gowrishankar Ganesh
- Caroline S. Langensiepen
- Klaus D. McDonald-Maier
- Thomas Blaffert
- Thomas Wittenberg
- Shenglan Liu
- Greg Aloupis
- Emmanuel Schmitt
- Lin Feng
- Jan Stühmer
- Pedro Ramos
- Deepak K. Gupta
- Devanshu Arya
Venues
- CoRR
- ICPR
- IEEE Access
- Pattern Recognit. Lett.
- CVPR
- ICDAR
- IROS
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- RO-MAN
- Sensors
- Pattern Recognit.
- Image Vis. Comput.
- CogSci
- CVPR Workshops
- Multim. Tools Appl.
- ROBIO
- Comput. Vis. Image Underst.
- DRR
- INTERSPEECH
- MVA
- Neural Networks
- Medical Imaging: Image Processing
- ICCV
- Int. J. Comput. Vis.
- RCAR
- Int. J. Pattern Recognit. Artif. Intell.
- KES
- Remote. Sens.
- ICCV Workshops
- UbiComp/ISWC Adjunct
- HIS
- Systems and Computers in Japan
- NeuroImage
- FUZZ-IEEE
- Comput. Electron. Agric.
- Intelligent Vehicles Symposium
- SMC
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