ATOMIC FORCE MICROSCOPY
Experts
- Ning Xi
- Lianqing Liu
- Guangyong Li
- Zaili Dong
- S. O. Reza Moheimani
- Michael G. Ruppert
- Yuechao Wang
- Michael R. P. Ragazzon
- Murti V. Salapaka
- Sean B. Andersson
- Ian R. Petersen
- Sergey Belikov
- Georg Schitter
- Sergei Magonov
- Hemanshu Roy Pota
- Li-Chen Fu
- Jan Tommy Gravdahl
- Wen Jung Li
- Andrew J. Fleming
- Josep Miquel Jornet
- Kamal Youcef-Toumi
- Luca Benini
- Takaharu Okajima
- Thorsten M. Buzug
- Jing Hou
- Tobias Knopp
- Yuen Kuan Yong
- Agus Subagyo
- Uchechukwu C. Wejinya
- M. S. Rana
- Kazuhisa Sueoka
- David M. Harcombe
- Yasuhiro Mukaigawa
- Abu Sebastian
- Daniele Palossi
- Qingze Zou
- Zhidong Wang
- Sajal K. Das
- Gaurav Sharma
Venues
- CoRR
- Sensors
- ACC
- NEMS
- NeuroImage
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Medical Imaging
- Microelectron. Reliab.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Biomed. Eng.
- IEEE Access
- EMBC
- NANOARCH
- IROS
- ICTON
- Microelectron. J.
- Proc. IEEE
- Int. J. Imaging Syst. Technol.
- MHS
- IEEE Trans. Control. Syst. Technol.
- Bildverarbeitung für die Medizin
- IEEE Trans Autom. Sci. Eng.
- J. Digit. Imaging
- SIAM J. Imaging Sci.
- ICRA
- ISBI
- CDC
- AIM
- Computational Imaging
- ROBIO
- IEEE SENSORS
- Remote. Sens.
- IEEE Trans. Image Process.
- Nano Commun. Networks
- IEEE Geosci. Remote. Sens. Lett.
- J. Imaging
- IEEE Trans. Ind. Electron.
- IEICE Trans. Electron.
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