APPEARANCE FEATURES
Experts
- Laura Leal-Taixé
- Aljosa Osep
- Bastian Leibe
- Pascal Fua
- Kris Kitani
- Luc Van Gool
- François Brémond
- Moongu Jeon
- Kuk-Jin Yoon
- Christophe De Vleeschouwer
- Jenq-Neng Hwang
- K. C. Amit Kumar
- Hans-Peter Seidel
- Ming-Hsuan Yang
- Xinshuo Weng
- Mubarak Shah
- Yunde Jia
- Jie Li
- Fuxin Li
- Patrick Dendorfer
- Long Lan
- Klaus Dietmayer
- Dimitris N. Metaxas
- Guillem Brasó
- Cheng-Yen Yang
- Michael J. Black
- Matti Pietikäinen
- Shoudong Han
- Qingshan Liu
- Zhen Lei
- Jeannette Bohg
- Wolfgang Koch
- Philip H. S. Torr
- Abhijeet Boragule
- Zhigang Luo
- Jonathon Luiten
- Seung Hwan Bae
- Martin Danelljan
- En Zhu
Venues
- CoRR
- CVPR
- ICCV
- ICRA
- ICIP
- IEEE Access
- ICPR
- IROS
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Comput. Vis.
- FUSION
- Comput. Vis. Image Underst.
- BMVC
- CVPR Workshops
- Neurocomputing
- Multim. Tools Appl.
- WACV
- Sensors
- IEEE Trans. Image Process.
- AVSS
- IEEE Trans. Circuits Syst. Video Technol.
- ACM Trans. Graph.
- IV
- IEEE Robotics Autom. Lett.
- Image Vis. Comput.
- AAAI
- RO-MAN
- Pattern Recognit. Lett.
- ICASSP
- ITSC
- IEEE Trans. Intell. Transp. Syst.
- ICME
- Vis. Comput.
- ICCV Workshops
- Remote. Sens.
- IEEE Signal Process. Lett.
- MFI
- ACIVS
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