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Study on the Variations in Precursor Parameters of Insulated Gate Bipolar Transistors and SiC MOSFETs for Fault Diagnosis.
Wei Wu
Yongqian Gu
Mingkang Yu
Yong Chen
Published in:
IECON (2023)
Keyphrases
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fault diagnosis
operating conditions
fault detection
field effect transistors
neural network
expert systems
multiple faults
real time
analog circuits
gas turbine
electronic equipment
power consumption
high density
fault detection and diagnosis
failure diagnosis
electrical power systems