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Derivation of test set for detecting multiple missing-gate faults in reversible circuits.
Dipak Kumar Kole
Hafizur Rahaman
Debesh K. Das
Bhargab B. Bhattacharya
Published in:
Comput. Electr. Eng. (2013)
Keyphrases
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test set
error rate
training set
test cases
training data
fault diagnosis
test data
database
evaluation methodology
fault detection
missing data
random selection
generalization error
high speed
video sequences
decision trees
data sets