Double Phase Fault Collapsing with Linear Complexity in Digital Circuits.
Raimund UbarLembit JurimagiElmet OrassonGalina JosifovskaStephen Adeboye OyeniranPublished in: DSD (2015)
Keyphrases
- linear complexity
- digital circuits
- model based diagnosis
- evolvable hardware
- data flow
- finite state machines
- fault diagnosis
- fault detection
- linear computational complexity
- functional decomposition
- training phase
- learning phase
- fault model
- repair actions
- neural network
- preprocessing phase
- failure modes
- integrity constraints
- special case
- search algorithm