Login / Signup

Nanochannels on silicon oxide surface fabricated by atomic force microscopy.

Zhiqian WangSteve TungNiandong JiaoZaili Dong
Published in: NEMS (2010)
Keyphrases
  • si sio
  • silicon dioxide
  • atomic force microscopy
  • metal oxide
  • high speed
  • leakage current
  • high temperature
  • space charge
  • transmission electron microscopy
  • silicon nitride
  • video sequences
  • d objects
  • x ray
  • solid state