Time-Varying and Multiresolution Envelope Analysis and Discriminative Feature Analysis for Bearing Fault Diagnosis.
Myeongsu KangJaeyoung KimLinda M. WillsJong-Myon KimPublished in: IEEE Trans. Ind. Electron. (2015)
Keyphrases
- fault diagnosis
- feature analysis
- multiresolution
- monitoring and fault diagnosis
- expert systems
- neural network
- fault detection and diagnosis
- fault detection
- genetic algorithm
- feature extraction
- face recognition
- electronic equipment
- rotating machinery
- fault tree
- unsupervised learning
- bp neural network
- operating conditions
- power transformers
- chemical process
- multiple faults
- real time