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Using Verilog VPI for Mixed Level Serial Fault Simulation in a Test Generation Environment.
Pedram A. Riahi
Zainalabedin Navabi
Fabrizio Lombardi
Published in:
Embedded Systems and Applications (2003)
Keyphrases
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test generation
simulation environment
test cases
design automation
fault diagnosis
symbolic execution
mobile robot
data sets
simulation model
real time embedded systems
quality assurance
fault detection
feature space
high level
image quality
test sequences
training data
information systems