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On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits .
Ruifeng Guo
Irith Pomeranz
Sudhakar M. Reddy
Published in:
Asian Test Symposium (1998)
Keyphrases
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test sequences
test cases
video sequences
image restoration
bit rate
test generation
mutation testing
image processing
high speed
circuit design
tunnel diode
delay insensitive
digital circuits
feature selection
data sets
analog circuits
asynchronous circuits
vector space
analog vlsi
high level