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Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator.
Antonio J. Ginés
Eduardo J. Peralías
Gildas Léger
Adoración Rueda
Guillaume Renaud
Manuel J. Barragan
Salvador Mir
Published in:
ETS (2016)
Keyphrases
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high speed
low power
real time
test data
data generator
scientific computing
signal processor
frame rate
case study
low cost
test cases
low latency
high reliability
low power consumption