Proof of the resolution-doubling of Random Illumination Microscopy using the variance of the speckled images.
Simon LabouesseJérôme IdierAnne SentenacMarc AllainThomas MangeatPublished in: EUSIPCO (2021)
Keyphrases
- illumination conditions
- image analysis
- lighting conditions
- image data
- input image
- imaging conditions
- high resolution
- image database
- pixel intensities
- image resolution
- higher resolution
- computer graphics
- electron microscopy
- outdoor scenes
- three dimensional
- varying illumination
- low resolution
- viewing angle
- test images
- image registration
- microscopy images
- noise sensitivity
- transformed images
- object recognition
- white light
- speckle noise
- illumination variations
- image classification
- image features
- viewpoint
- texture information
- ultrasound images
- image set
- light source
- feature points
- edge detection
- global illumination
- multiresolution
- illumination correction
- highest resolution
- image retrieval