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Experts
- Shree K. Nayar
- Rui Zhang
- Leonidas J. Guibas
- Takahiko Horiuchi
- Jitendra Malik
- Katsushi Ikeuchi
- David A. Forsyth
- Yong Zeng
- Amit Singer
- Shuowen Zhang
- Masaru Tsuchida
- Keita Hirai
- Pierre Alliez
- Hiroshi Murase
- Abhijeet Ghosh
- Tien-Tsin Wong
- Sabine Süsstrunk
- Graham D. Finlayson
- Slobodan Ilic
- Sanja Fidler
- Pieter Peers
- Peter N. Belhumeur
- Yoichi Sato
- Sylvia C. Pont
- Thomas K. Leung
- Yikang Li
- Masayuki Mukunoki
- Masayuki Sugawara
- Xiaowu Chen
- Masaki Emoto
- Chi-Sing Leung
- Ingela Nyström
- Mariko Yamaguchi
- Paul E. Debevec
- Takahiro Matsumoto
- Tobi Vaudrey
- Bedrich Benes
- Shoji Tominaga
- Tetsuro Tokunaga
Venues
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- ACM Trans. Graph.
- IEEE Trans. Image Process.
- SD&A
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- IEEE Trans. Instrum. Meas.
- J. Electronic Imaging
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- Pattern Recognit. Lett.
- Comput. Graph. Forum
- IEEE Geosci. Remote. Sens. Lett.
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- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Vis. Comput.
- Hum. Factors
- Comput. Electron. Agric.
- Multim. Tools Appl.
- Signal Process. Image Commun.
- Signal Image Video Process.
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