Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG.
Andreas G. VenerisRobert ChangMagdy S. AbadirSep SeyediPublished in: J. Electron. Test. (2005)
Keyphrases
- logic circuits
- test generation
- low power
- test cases
- symbolic execution
- design automation
- functional decomposition
- tunnel diode
- quality assurance
- logic synthesis
- static analysis
- gate array
- low cost
- fault diagnosis
- power dissipation
- expert systems
- power consumption
- high speed
- artificial intelligence
- open source
- code coverage
- image processing
- database systems