Fast test generation for sequential circuits.

Todd P. Kelsey Kewal K. Saluja

Published in: ICCAD (1989)

Keyphrases

test generation
test cases
test sequences
design automation
symbolic execution
mutation testing
static analysis
quality assurance
high speed
software testing
test data generation
artificial intelligence
test set
pattern matching
databases
image data
regression testing
relational databases
multi agent
code coverage