Robustness of circuits under delay-induced faults : test of AES with the PAFI tool.

Olivier Faurax Assia Tria Laurent Freund Frédéric Bancel

Published in: IOLTS (2007)

Keyphrases

built in self test
test cases
fault model
integrated circuit
high speed
neural network
fault models
low cost
fault diagnosis
computational efficiency
user friendly
test sequences
digital circuits
power dissipation