as a Gate Oxide.

Shun Sugiura Shigeru Kishimoto Takashi Mizutani Masayuki Kuroda Tetsuzo Ueda Tsuyoshi Tanaka

Published in: IEICE Trans. Electron. (2008)

Keyphrases

leakage current
silicon dioxide
field effect transistors
low voltage
steady state
silicon nitride
high density
fuel cell
high temperature
multiple input
machine learning
power line
metal oxide
design considerations
room temperature
search algorithm
electrical properties
nano scale
database systems
image processing