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Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation.
Fuqiang Li
Xiaoqing Wen
Kohei Miyase
Stefan Holst
Seiji Kajihara
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2016)
Keyphrases
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test generation
shortest path
high speed
artificial intelligence
computer vision
high level
query language
test cases
power consumption
life cycle
test sequences
design automation