Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements.
Kazuki MontaLeonidas KatselasFerenc FodorTakuji MikiAlkis A. HatzopoulosMakoto NagataErik Jan MarinissenPublished in: IEEE Des. Test (2022)
Keyphrases
- information retrieval
- low cost
- high speed
- information retrieval systems
- embedded systems
- analog vlsi
- high density
- dynamic random access memory
- query expansion
- digital images
- test cases
- retrieval effectiveness
- information access
- programmable logic
- text retrieval
- test set
- evaluation measures
- generation process
- measured data
- measurement noise
- ir evaluation
- web ir
- relevance feedback