IR EVALUATION
Experts
- Tetsuya Sakai
- Noriko Kando
- Ian Soboroff
- Ellen M. Voorhees
- Donna Harman
- Gareth J. F. Jones
- Ben Carterette
- Atsushi Fujii
- Mark Sanderson
- Douglas W. Oard
- Guido Zuccon
- Nick Craswell
- Charles L. A. Clarke
- Stephen E. Robertson
- Makoto Iwayama
- W. Bruce Croft
- William R. Hersh
- Matthew Lease
- Nicola Ferro
- Gabriella Pasi
- Stefano Mizzaro
- Iadh Ounis
- Maarten de Rijke
- Craig Macdonald
- Mücahid Kutlu
- Nicholas J. Belkin
- Fernando Llopis
- Mihai Lupu
- Arjen P. de Vries
- Falk Scholer
- Steve Walker
- Jimmy Lin
- Gordon V. Cormack
- Norbert Fuhr
- Ruihua Song
- Tomek Strzalkowski
- Bevan Koopman
- Hideo Joho
- Philipp Schaer
Venues
- TREC
- NTCIR
- SIGIR
- CoRR
- SIGIR Forum
- Inf. Process. Manag.
- CLEF
- CIKM
- ECIR
- CLEF (Working Notes)
- ICTIR
- EVIA@NTCIR
- J. Assoc. Inf. Sci. Technol.
- Inf. Retr.
- J. Documentation
- LREC
- J. Am. Soc. Inf. Sci.
- Sensors
- ISI
- WWW (Companion Volume)
- IEEE Access
- AIRS
- ACM Trans. Inf. Syst.
- BIR@ECIR
- WSDM
- AMIA
- ICTON
- ECIR (2)
- ISCAS
- CHIIR
- Inf. Res.
- HLT
- LWA
- Inf. Retr. J.
- IEEE Trans. Circuits Syst. II Express Briefs
- Scientometrics
- ECIR (1)
- AICCSA
- DESIRES
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