Kazuki Monta

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 9

Top Topics

Pattern Generation

Integrated Circuit

Top Venues

Publications

Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata
On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. COSADE (2024)
Henian Li, Lang Lin, Norman Chang, Sreeja Chowdhury, Dylan Mcguire, Bozidar Novakovic, Kazuki Monta, Makoto Nagata, Ying-Shiun Li, Pramod M. S, Piin-Chen Yeh, J.-S. Roger Jang, Chengjie Xi, Qiutong Jin, Navid Asadi, Mark M. Tehranipoor
Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation. HOST (2024)
Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Makoto Nagata
Characterization of Backside ESD Impacts on Integrated Circuits. IRPS (2023)
Kazuki Monta, Makoto Nagata, Josep Balasch, Ingrid Verbauwhede
On the Unpredictability of SPICE Simulations for Side-Channel Leakage Verification of Masked Cryptographic Circuits. DAC (2023)
Kazuki Monta, Lang Lin, Jimin Wen, Harsh Shrivastav, Calvin Chow, Hua Chen, Joao Geada, Sreeja Chowdhury, Nitin Pundir, Norman Chang, Makoto Nagata
Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis. ACM J. Emerg. Technol. Comput. Syst. 19 (1) (2023)
Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements. IEEE Des. Test 39 (5) (2022)
Lang Lin, Deqi Zhu, Jimin Wen, Hua Chen, Yu Lu, Norman Chang, Calvin Chow, Harsh Shrivastav, Chia-Wei Chen, Kazuki Monta, Makoto Nagata
Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification. HOST (2021)
Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. ETS (2021)
Lang Lin, Dinesh Selvakumaran, Deqi Zhu, Norman Chang, Calvin Chow, Makoto Nagata, Kazuki Monta
Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis. iSES (2020)