Characterization of Backside ESD Impacts on Integrated Circuits.

Takuya Wadatsumi Kohei Kawai Rikuu Hasegawa Kazuki Monta Takuji Miki Makoto Nagata

Published in: IRPS (2023)

Keyphrases

integrated circuit
pattern recognition
electron beam
decision making
feature extraction
bayesian networks
image analysis
life cycle