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Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring.
Kazuki Monta
Leonidas Katselas
Ferenc Fodor
Alkis A. Hatzopoulos
Makoto Nagata
Erik Jan Marinissen
Published in:
ETS (2021)
Keyphrases
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pattern generation
information retrieval
monitoring system
embedded systems
low cost
swarm robots
high speed
test cases
real time
high density
cellular automaton
query expansion
retrieval effectiveness
dynamic range
circuit design
physical design
analog vlsi