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A Versatile Built-In Self-Test Scheme for Delay Fault Testing.

Y. TsiatouhasTh. HaniotakisAngela ArapoyanniDimitris Nikolos
Published in: DATE (2000)
Keyphrases
  • neural network
  • real time embedded systems
  • fault model
  • built in self test
  • fault diagnosis
  • fault detection
  • case study
  • fuzzy logic
  • recognition scheme