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Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times.

Haralampos-G. D. StratigopoulosManuel J. BarraganSalvador MirHervé Le GallNeha BhargavaAnkur Bal
Published in: ITC (2015)
Keyphrases
  • low cost
  • mixed signal
  • low power
  • vlsi circuits
  • multi channel
  • high speed
  • single chip
  • real time
  • edge detection
  • test cases
  • video sequences
  • power dissipation
  • built in self test