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Test generation for sequential circuits using parallel fault simulation with random inputs.
Yuzo Takamatsu
Isao Higashi
Tsuyoshi Kodama
Published in:
Systems and Computers in Japan (1995)
Keyphrases
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test generation
test cases
design automation
test sequences
neural network
static analysis
fault detection
mutation testing
software testing
data sets
case study
image data
fault diagnosis
parallel processing
quality assurance
symbolic execution