On-chip Test and Repair of Memories for Static and Dynamic Faults.

Sanjay K. Thakur Rubin A. Parekhji Arun N. Chandorkar

Published in: ITC (2006)

Keyphrases

built in self test
test cases
low cost
integrated circuit
real time
fault diagnosis
fault detection
case study
operating system
test data
high density
test sequences
fault isolation
analog vlsi