Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor.
Sankar GurumurthyShobha VasudevanJacob A. AbrahamPublished in: ITC (2006)
Keyphrases
- instruction set
- automatic detection
- level parallelism
- sequence similarity
- hidden markov models
- detection algorithm
- detection method
- memory hierarchy
- fault diagnosis
- automatically generate
- high speed
- multimedia
- long sequences
- floating point
- fault detection
- error detection
- single chip
- structural information
- instructional design
- parallel processing
- test sequences
- sequential patterns
- test cases
- data structure
- real time
- ibm zenterprise