Testing Inter-Word Coupling Faults of Wide I/O DRAMs.

Che-Wei Chou Yong-Xiao Chen Jin-Fu Li

Published in: ATS (2015)

Keyphrases

test cases
fault model
input output
fault detection
wide range
n gram
fault diagnosis
word recognition
co occurrence
natural language text
knowledge base
word sense disambiguation
multiple faults
data sets
noun phrases
software testing
test set
feature selection