Sign in
Fault simulation and response compaction in full scan circuits using HOPE.
Sunil R. Das
Chittoor V. Ramamoorthy
Mansour H. Assaf
Emil M. Petriu
Wen-Ben Jone
Mehmet Sahinoglu
Published in:
IEEE Trans. Instrum. Meas. (2005)
Keyphrases
</>
simulation model
fault detection
fault diagnosis
decision making
high speed
tunnel diode
data sets
fault models
vlsi circuits
simulation study
range images
evolutionary algorithm
expert systems
decision trees
information systems
artificial intelligence
information retrieval