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BIST Generators for Sequential Faults.
Shujian Zhang
Rod Byrne
D. Michael Miller
Published in:
ICCD (1992)
Keyphrases
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built in self test
integrated circuit
fault diagnosis
fault detection
multiple faults
test cases
artificial intelligence
neural network
sequential search
expert systems
open source
databases
similarity measure
case study
decision making
sequential data
fault model