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Fast Test Integration: Toward Plug-and-Play At-Speed Testing of Multiple Clock Domains Based on IEEE Standard 1500.

Po-Lin ChenYu-Chieh HuangTsin-Yuan Chang
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
  • high speed
  • test cases
  • test data
  • test generation
  • testing process
  • test sequences
  • integration testing
  • data integration
  • code coverage
  • real time
  • machine learning
  • information systems
  • database systems
  • statistical tests