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The suppression of tin whisker growth by the coating of tin oxide nano particles and surface treatment.

Albert T. WuY. C. Ding
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • si sio
  • three dimensional
  • electron microscopy
  • nano scale
  • light scattering
  • range data
  • printed circuit boards
  • silicon dioxide
  • d objects
  • edge detection
  • x ray
  • manufacturing process
  • high temperature