Fabric defect detection based on adaptive local binary patterns.
Rong FuMeihong ShiHongli WeiHuijuan ChenPublished in: ROBIO (2009)
Keyphrases
- local binary pattern
- texture classification
- texture analysis
- multiscale
- face recognition
- illumination invariant
- feature extraction
- texture descriptors
- spatial information
- rotation invariant
- face detection
- facial expression recognition
- texture features
- feature descriptors
- scale invariant
- scale and rotation invariant
- background subtraction
- texture information
- binary patterns
- speeded up robust features
- support vector