Towards finding path delay fault tests with high test efficiency using ZBDDs.

Maria K. Michael Kyriakos Christou Spyros Tragoudas

Published in: ICCD (2005)

Keyphrases

test data
statistical tests
high efficiency
fault diagnosis
post hoc
test cases
test generation
test suite
high precision
maintenance cost
diagnostic tests
neural network
multiple paths
null hypothesis
multiple choice
shortest path
computational complexity