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A register-transfer-level fault simulator for permanent and transient faults in embedded processors.

C. RousselleMatthias PflanzA. BehlingT. MohauptHeinrich Theodor Vierhaus
Published in: DATE (2001)
Keyphrases
  • fault diagnosis
  • fault detection
  • embedded processors
  • fault model
  • multiple faults
  • real time
  • steady state
  • single chip
  • multimedia
  • subband
  • machine vision
  • fault detection and isolation