Programmable restricted SEC codes to mask permanent faults in semiconductor memories.

Samuel Evain Yannick Bonhomme Valentin Gherman

Published in: IOLTS (2010)

Keyphrases

digital signal processors
fault diagnosis
high speed
error detection
error correction
low cost
fault detection
fault model
associative memory
general purpose
model based diagnosis
information systems
production line
semiconductor manufacturing
error control
database
decoding algorithm
multiple faults