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Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling.

Felice CrupiMassimo AliotoJacopo FrancoPaolo MagnoneBen KaczerGuido GroesenekenJérôme MitardLiesbeth WittersThomas Y. Hoffmann
Published in: ISCAS (2011)
Keyphrases
  • viewpoint
  • power system
  • real time
  • neural network
  • data sets
  • databases
  • thin film
  • electric field
  • electrical power
  • information retrieval
  • website
  • evolutionary algorithm
  • multi layer
  • high voltage
  • metal oxide