Test Generation for Designs with On-Chip Clock Generators.
Xijiang LinMark KassabPublished in: Asian Test Symposium (2009)
Keyphrases
- test generation
- high speed
- nm technology
- power consumption
- test cases
- test sequences
- symbolic execution
- design automation
- low power
- low cost
- quality assurance
- software testing
- static analysis
- mutation testing
- power dissipation
- test data generation
- circuit design
- artificial intelligence
- application specific integrated circuits
- video sequences
- image processing