A Novel Approach to Random Pattern Testing of Sequential Circuits.

Lama Nachman Kewal K. Saluja Shambhu J. Upadhyaya Robert Reuse

Published in: IEEE Trans. Computers (1998)

Keyphrases

pattern matching
test cases
high speed
sequential search
software testing
test data
pattern detection
digital circuits
statistical tests
real time
multiscale
pattern discovery
hidden markov models
test generation
image sequences
logic circuits
information systems