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Redundancy removal and test generation for circuits with non-Boolean primitives.
Srimat T. Chakradhar
Steven G. Rothweiler
Vishwani D. Agrawal
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
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test generation
test cases
symbolic execution
test sequences
static analysis
design automation
boolean functions
quality assurance
software testing
mutation testing
high speed
circuit design
truth table
multi valued
building blocks
software systems
code coverage
high level