Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures.

René Kothe Heinrich Theodor Vierhaus

Published in: DSD (2010)

Keyphrases

test data
test cases
training data
test set
data sets
power consumption
training set
test suite
databases
testing process
search based testing
database
test generation
training samples
high resolution
support vector
computer vision