René Kothe

Publication Activity (10 Years)

Years Active: 2005-2010
Publications (10 Years): 0

Publications

René Kothe, Heinrich Theodor Vierhaus
Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures. DSD (2010)
Heinrich Theodor Vierhaus, René Kothe
Embedded Diagnostic Logic Test Exploiting Regularity. DSD (2008)
René Kothe, Heinrich Theodor Vierhaus
A Scan Controller Concept for Low Power Scan Tests. J. Low Power Electron. 4 (3) (2008)
R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus
A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS (2007)
René Kothe, Heinrich Theodor Vierhaus
Flip-Flops and Scan-Path Elements for Nanoelectronics. DDECS (2007)
René Kothe, Christian Galke, Sabine Schultke, Henry Fröschke, Steffen Gaede, Heinrich Theodor Vierhaus
Hardware/Software Based Hierarchical Self Test for SoCs. DDECS (2006)
S. Habermann, René Kothe, Heinrich Theodor Vierhaus
Built-in Self Repair by Reconfiguration of FPGAs. IOLTS (2006)
René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube
Embedded Self Repair by Transistor and Gate Level Reconfiguration. DDECS (2006)
Christian Galke, René Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. IOLTS (2006)
Christian Galke, René Kothe, Heinrich Theodor Vierhaus
Logic Self Repair. ARCS Workshops (2006)
René Kothe, Christian Galke, Heinrich Theodor Vierhaus
A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. IOLTS (2005)