Sign in
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.
Christian Galke
René Kothe
Sabine Schultke
K. Winkler
Jeanette Honko
Heinrich Theodor Vierhaus
Published in:
IOLTS (2006)
Keyphrases
</>
image features
co occurrence
feature vectors
low level
machine learning
test sequences
model based diagnosis
structural information
false positives
feature set
neural network
test cases
svm classifier
expert systems
salient features
feature space
feature values
specific features