Christian Galke

Publication Activity (10 Years)

Years Active: 2000-2007
Publications (10 Years): 0

Publications

R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus
A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS (2007)
René Kothe, Christian Galke, Sabine Schultke, Henry Fröschke, Steffen Gaede, Heinrich Theodor Vierhaus
Hardware/Software Based Hierarchical Self Test for SoCs. DDECS (2006)
Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus
Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD (2006)
Christian Galke, René Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. IOLTS (2006)
Christian Galke, René Kothe, Heinrich Theodor Vierhaus
Logic Self Repair. ARCS Workshops (2006)
René Kothe, Christian Galke, Heinrich Theodor Vierhaus
A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. IOLTS (2005)
Claudia Kretzschmar, Christian Galke, Heinrich Theodor Vierhaus
A Hierarchical Self Test Scheme for SoCs. IOLTS (2004)
Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check. J. Electron. Test. 19 (5) (2003)
Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus
Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. IOLTS (2003)
Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus
A Test Processor Concept for Systems-on-a-Chip. ICCD (2002)
Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus
On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. IOLTW (2002)
Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus
On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. IOLTW (2002)
Matthias Pflanz, Christian Galke, Heinrich Theodor Vierhaus
A new method for on-line state machine observation for embedded microprocessors. HLDVT (2000)