A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.
René KotheChristian GalkeHeinrich Theodor VierhausPublished in: IOLTS (2005)
Keyphrases
- expert systems
- feature vectors
- feature set
- artificial intelligence
- feature space
- co occurrence
- low level
- feature analysis
- test cases
- benchmark datasets
- image classification
- software development
- image features
- classification accuracy
- data sets
- support vector
- feature extraction
- computer vision
- genetic algorithm
- data mining