A Configurable Modular Test Processor and Scan Controller Architecture.
R. Frost BrandenburgD. RudolphChristian GalkeRené KotheHeinrich Theodor VierhausPublished in: IOLTS (2007)
Keyphrases
- control architecture
- real time
- matlab simulation
- control system
- high speed
- multi processor
- neural network
- instruction set
- memory management
- parallel architecture
- parallel processing
- management system
- computation intensive
- multithreading
- highly flexible
- test cases
- control scheme
- control method
- control algorithm
- closed loop
- industry standard
- modular architecture
- systolic array