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Embedded Self Repair by Transistor and Gate Level Reconfiguration.

René KotheHeinrich Theodor VierhausTorsten CoymWolfgang VermeirenBernd Straube
Published in: DDECS (2006)
Keyphrases
  • high speed
  • higher level
  • levels of abstraction
  • real time
  • low power
  • artificial intelligence
  • case study
  • multiscale
  • query answering
  • manufacturing systems
  • failure rate
  • silicon dioxide