Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression.

Anshuman Chandra Krishnendu Chakrabarty

Published in: DATE (2002)

Keyphrases

test data
test cases
training data
test set
testing process
search based testing
test suite
software testing
training set
test data generation
database
regression testing
training and test data
white box testing
test generation
image compression
support vector machine
active learning
feature vectors
image processing